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IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec) | lit.salon

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IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)

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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada : proceedings2000
With Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal

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2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada : proceedings2000
With Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal
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