2000 IEEE International Workshop on Defect Based Testing
by IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal
200082 pages
IEEE Computer Society·2 editions
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2000 IEEE International Workshop on Defect Based Testing (2000)
2000 IEEE International Workshop on Defect Based Testing (2000)
IEEE Computer Society
IEEE Computer Society
ISBN 10: 0769506372