Controlled Removal by Ion Beam Etching of Surface Contaminant Layers on Transmission Electron Microscope Specimens
by A.W. James
19866 pages
AEA Technology Plc·1 editions
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Controlled Removal by Ion Beam Etching of Surface Contaminant Layers on Transmission Electron Microscope Specimens (1986)
Controlled Removal by Ion Beam Etching of Surface Contaminant Layers on Transmission Electron Microscope Specimens (1986)
AEA Technology Plc
AEA Technology Plc
Paperback
ISBN 10: 0705812421
ISBN 13: 9780705812429