Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
by L.J. Balk
2000310 pages
PERGAMON PRESS·1 editions
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Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (2000)
Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (2000)
PERGAMON PRESS
PERGAMON PRESS
Hardcover
ISBN 10: 0080439152
ISBN 13: 9780080439150