Applications of X-Ray Topographic Methods to Materials Science
by France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science (1983 Snowmass Village, Colo.), Sigmund Weissmann, Françoise Balibar, Jean-Francois Petroff
1984536 pages
Springer·2 editions
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Applications of X-Ray Topographic Methods to Materials Science (1984)
Applications of X-Ray Topographic Methods to Materials Science (1984)
Springer
Springer
Hardcover
ISBN 10: 030641838X
ISBN 13: 9780306418389