Nondestructive Evaluation and Reliability of Micro and Nanomaterial Systems (Proceedings of SPIE)
by George Y. Baaklini, Norbert Meyendorf, Bernd Michel
2002238 pages
SPIE Society of Photo-Optical Instrumentation Engi·1 editions
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Nondestructive Evaluation and Reliability of Micro and Nanomaterial Systems (Proceedings of SPIE) (2002)
Nondestructive Evaluation and Reliability of Micro and Nanomaterial Systems (Proceedings of SPIE) (2002)
SPIE Society of Photo-Optical Instrumentation Engi, SPIE
SPIE Society of Photo-Optical Instrumentation Engi, SPIE
Paperback
ISBN 10: 0819444510
ISBN 13: 9780819444516