Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
1986
Springer US·1 editions
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis (1986)
Advanced Scanning Electron Microscopy and X-Ray Microanalysis (1986)
Springer US
Springer US
Elektronische Ressource
ISBN 10: 1475790279
ISBN 13: 9781475790276