In Situ Real-Time Characterization of Thin Films
2000280 pages
Wiley-Interscience·3 editions
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In Situ Real-Time Characterization of Thin Films (2000)
In Situ Real-Time Characterization of Thin Films (2000)
Wiley-Interscience
Wiley-Interscience
ISBN 10: 0471241415
ISBN 13: 9780471241416