01
Carbon-Based Electronics Transistors and Interconnects at the Nanoscale
An early work in this author overview with a supported 2015 catalog date.
Author
Yao Xu
2 cataloged contributions
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A considered starting point for reading Yao Xu, drawn from catalog context and salon activity when available.
02
Dam Failure Mechanisms and Risk Assessment
A recorded contribution selected from this stable author overview.
The catalog
Bibliography
2 works
No contribution clears the current Core threshold, so all cataloged contributions are shown.
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3 cataloged editions
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4 cataloged editions
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