01
Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30-31 July 2000, San Diego, USA
The earliest high-confidence catalog date in this author overview is 2000.
Author
Angela Duparré
6 cataloged contributions
2000–2008 across 6 high-confidence dated works
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A considered starting point for reading Angela Duparré, drawn from catalog context and salon activity when available.
02
Optical metrology roadmap for the semiconductor, optical, and data storage industries II: 2-3 August, 2001, San Diego, USA
A clearly attributed work with a supported 2001 catalog date.
03
Advanced characterization techniques for optical, semiconductor, and data storage components: 9-11 July 2002, Seattle, Washington, USA
A clearly attributed work with a supported 2002 catalog date.
04
Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA
A clearly attributed work with a supported 2003 catalog date.
05
Advanced characterization techniques for optics, semiconductors, and nanotechnologies III 28-29 August 2007, San Diego, California, USA
A clearly attributed work with a supported 2007 catalog date.
06
Optical fabrication, testing and metrology III 2-4 September 2008. Glasgow, United Kingdom
A clearly attributed work with a supported 2008 catalog date.
The catalog
Bibliography
6 works
Core ranking is using the catalog’s provisional quality order while the versioned ranking population is prepared.
2 cataloged editions
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1 cataloged edition
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2 cataloged editions
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