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W. Murray Bullis | lit.salon

Author

W. Murray Bullis

Born 1930

7 works

1968–1996 across 7 dated works

No biography is available yet.

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Measurement of carrier lifetime in semiconductors: an annotated bibliography covering the period 1949-19671968
Measurement methods for the semiconductor device industry - a summary of NBS activity1969
Metrology for submicrometer devices and circuits1980
Evolution of silicon materials characterization: lessons learned for improved manufacturing1993

Books

7 works

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Semiconductor Characterization: Present Status and Future Needs1996
With David G. Seiler, A. C. Diebold
1 edition
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Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry1995
4 editions
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Semiconductor measurement technology: evolution of silicon materials characterization : lessons learned for improved manufacturing1993
2 editions
shelves
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reviews
0
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Measurement methods for the semiconductor device industry - a summary of NBS activity1969
1 edition
shelves
0
reviews
0
lists
0
quotes
0
Measurement of carrier lifetime in semiconductors: an annotated bibliography covering the period 1949-19671968
1 edition
shelves
0
reviews
0
lists
0
quotes
0
Metrology for submicrometer devices and circuits1980
1 edition
shelves
0
reviews
0
lists
0
quotes
0
Evolution of silicon materials characterization: lessons learned for improved manufacturing1993
1 edition
shelves
0
reviews
0
lists
0
quotes
0

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