Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings)
by J. R. Llyod, P. S. Ho, C. T. Fah, E. Yost
1991354 pages
Materials Research Society·1 editions
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Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings) (1991)
Materials Reliability Issues in Microelectronics (Materials Research Society Symposium Proceedings) (1991)
Materials Research Society
Materials Research Society
Hardcover
ISBN 10: 1558991190
ISBN 13: 9781558991194