Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
by Manoj Sachdev, José Pineda de Gyvez
2007328 pages
Springer·3 editions
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) (2007)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) (2007)
Springer
Springer
ISBN 10: 0387465464
ISBN 13: 9780387465463