VLSI Test Principles and Architectures
by Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu
2006808 pages
Morgan Kaufmann·3 editions
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VLSI Test Principles and Architectures (2006)
VLSI Test Principles and Architectures (2006)
Morgan Kaufmann
Morgan Kaufmann
ISBN 10: 0123705975
ISBN 13: 9780123705976