Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
2003180 pages
Springer·3 editions
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Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing) (2003)
Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing) (2003)
Springer
Springer
Hardcover
ISBN 10: 140207235X
ISBN 13: 9781402072352